7 Test Methodology y All measurements were taken on the same pSeries server.   y Drives measured were equipped with the SCSI LVD interface y Each adapter card was slotted into a 64 bit 66 MHz 3.3V Slot.   y The tests were done sequentially with no other activity on the processor. y All measurements were taken with the tape cartridge loaded at the beginning of the tape. y The tool used for taking the measurements, was written by an IBM employee specifically for performance analysis of tape subsystems.  The tool writes blocks from memory, eliminating many performance degrading factors found in production environments.   Page 18 of 20 p1   p2   p3   p4   p5   p6   p7   p8   p9   p10   p11   p12
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